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Ultrahigh-resolution rapid-scan ultraviolet-visible spectrometer

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Abstract

This paper describes and gives preliminary numerical calculations for a spectrometer that combines a moving double-sided-mirror interferometer with a plane transmission grating. In one scan period, multiple interferograms are produced simultaneously, each with a separate wavelength range and located in a separate pixel of a linear detector. The spectrometer has the advantage of providing the ultrahigh spectral resolution of interferometry for a wide spectral range (e.g., 0.005 nm at 250 nm together with 0.02 nm at 450 nm), while avoiding the multiplex disadvantage of interferometry in ultraviolet-visible spectral region, and relaxing the dynamic range requirement of the detector. It will be applicable to ultrahigh-resolution rapid-scan ultraviolet-visible spectral measurement.

© 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

1. Introduction

Since Isaac Newton first defined the “spectrum” in 1704 by separating sunlight into its constituent colors with a prism, spectroscopy has been developed significantly. Spectroscopy was first applied to astronomy in 1817 by Joseph Fraunhofer to study the solar atmosphere components. Today it is an important and efficient way to study the stars and trace the origin of the universe. It is currently much used for various kinds of scientific research and industrial applications. Based on different detection schemes, spectrometers are divided into four categories. The first category is color filter spectrometer that uses either a set of band-pass filters, a circular-variable filter, a liquid-crystal tunable filter or an acousto-optical tunable filter to get spectral information [1,2]. The second category is dispersive spectrometer that is based on either a prism, a grating or both to achieve the dispersion of light [3–9]. The third category is interferometric spectrometer (i.e., Fourier transform spectrometer) that is based on temporal interferometry or spatial interferometry [10–16]. The fourth category is coherent-dispersion spectrometer that combines interferometric and dispersive spectroscopy to obtain spectral information [17,18].

In the infrared spectral region, the detector noise exceeds all other noise sources and is independent of the incident radiation power, so the throughput and multiplex are the two advantages of interferometric over dispersive spectroscopy. In the ultraviolet-visible spectral region, the photon noise is the limiting factor and the noise level is proportional to the square root of the incident power, so the performance of the interferometric spectroscopy is weakened to measure a broadband source in the ultraviolet and visible regions [19]. One of the greatest disadvantages of existing ultraviolet-visible multiplexed spectroscopy for a broadband source is the multiplex disadvantage [14,19–23]. Except for filtering the light before detection [24,25], the coherent-dispersion spectrometer proposed in [17] is a very effective method to solve the multiplex disadvantage, but unfortunately it cannot obtain very high spectral resolution.

The temporal interferometry based on linear scanning is the very successful design to obtain ultrahigh spectral resolution for a broadband spectral range. The biggest problem associated with the use of a Michelson interferometer as a Fourier-transform spectrometer is the tilt of the moving plane mirror during scanning, which has been successfully solved by using the cat’s-eye system or corner-cube-mirror system. However, as a moving element, the volume and weight make the corner-cube-mirror or cat’s-eye retroreflector unsuitable for rapid scan.

The grating can give higher and more linear dispersion of the wavelength than the prism. Today the high quality transmission gratings can rival reflection gratings in all aspects, therefore, the transmission gratings can be used as dispersive devices in the infrared, visible, or near-ultraviolet regions [26–28].

2. Principle

This paper presents an ultrahigh-resolution rapid-scan ultraviolet-visible spectrometer (UVS), which combines a moving double-sided-mirror interferometer with a plane transmission grating. Figure 1

 figure: Fig. 1

Fig. 1 Optical layout of the ultraviolet-visible spectrometer (UVS).

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shows the optical layout of the UVS. The moving double-sided-mirror interferometer is comprised of one moving double-sided mirror (DSM), one fixed plane mirror, one fixed corner-cube mirror, and one beam splitter. The DSM is a plane-parallel glass plate with both faces coated with high-reflectivity films. The DSM enables the two beams reflecting from its surfaces to remain parallel to each other [15]. The self-compensation in the corner-cube mirror and the use of the DSM enable the interferometer to solve both the tilt of the moving plane mirror and the shear of a single corner-cube mirror. Moreover, compared with the corner-cube-mirror or cat’s-eye retroreflector, the smaller volume and lighter weight enable the DSM to have the benefit and potential to move short distances quite rapidly. Therefore, the use of specific electronics downstream will make the moving DSM suitable for rapid scan [11,15]. The optical path difference (OPD) is created by the straight reciprocating motion of the moving DSM driven by a linear actuator. The OPD value is four times the displacement l of the moving DSM from the zero path difference (ZPD) position. The light source is located at the front focal plane of the collimating lens, and the one-dimensional detector is located at the back focal plane of the collecting lens.

The UVS generates multiple interferograms simultaneously in one scan period of the moving DSM, each interferogram with a separate wavelength range and located in a separate pixel of the linear detector. More specifically, not only the grating spreads the spectral information onto a one-dimensional detector, but also the interferometer produces multiple interferograms simultaneously in one scan period of the moving DSM, each interferogram covering a separate wavelength range controlled by the grating and detector geometry, each interferogram located in a separate pixel of the detector. The UVS integrates interferometric and dispersive spectroscopy to get spectral information.

When measuring an ultraviolet-visible narrow-band or an infrared broad-band source, Fourier transform spectrometer can perform high spectral resolution measurements [19]. The UVS uses a grating to divide a broadband spectral range into many narrow bands, and then uses interferometry to achieve ultrahigh spectral resolution for each narrow band. Consequently, the UVS can achieve ultrahigh spectral resolution for a broadband spectral range in the ultraviolet-visible spectral region. By dispersing the light with a plane transmission grating instead of a prism, mainly because the grating can provide higher and more linear dispersion of the wavelength than the prism, and it is also a potential tradeoff with the throughput advantage of a typical Fourier transform spectrometer. The thickness of a plane transmission grating can be relatively small, so the geometrical length of the light path in a plane transmission grating can be smaller than that in a prism. Therefore, for the loss of light energy caused by material absorption, a plane transmission grating can be smaller than a prism when the same material is used.

For the UVS design, the center fringes are spread into multiple separate pixels (interferograms), each with a separate wavelength range, and therefore the dynamic range requirement of the detector is reduced [29].

Figure 2

 figure: Fig. 2

Fig. 2 Equivalent light path diagram in the meridian plane of the UVS.

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shows the equivalent light path diagram in the meridian plane of the UVS. The grating equation for a plane transmission grating is given by [30]
mλi=d[n(λi)sinα+sinθm(λi)].
where m is the diffraction order that is an integer, λi is the wavelength of light, d is the groove spacing of grating, n(λi) is the refractive index of the plane transmission grating for wavelength λi, α is the incidence angle measured from the grating normal, θm(λi) is the m-order diffraction angle measured from the grating normal for wavelength λi.

Suppose that f is the focal length of the collecting lens, b is the pixel size of the detector, λc is the central wavelength of the source spectra, y(λi) is the y-axis coordinate for wavelength λi at the detector plane, and the y-axis coordinate for wavelength λc at the detector plane is y(λc)=0. Let the optical axis of the collecting lens overlap with the diffracted light ray from the grating of the central wavelength. It can be obtained that

y(λi)=fτ(λc)1τ2(λi)τ(λi)1τ2(λc)1τ2(λc)1τ2(λi)+τ(λc)τ(λi),
where

τ(λ)=λdn(λ)sinα.

The interferogram k located in pixel k of one-dimensional detector covers a wavelength range from λk1 to λkj which is determined by |y(λkj)y(λk1)|b. When the source spectrum covers a wavelength range from λmin to λmax (i.e., a wavenumber range from σmin=1/λmax to σmax=1/λmin), the number of pixels of the one-dimensional detector is determined by

N|y(λmax)y(λmin)|b.
For convenience, based on Nyquist criterion, the sampling interval for each interferogram produced by the UVS can be given as

X12σmax.

The interferogram I(l) is given by

I(l)=0B(σ)[1+cos(8πσl)]dσ.
where l is the displacement of the moving DSM from the ZPD position, σ is the wave number, and B(σ) is the input spectral intensity at a wavenumber σ.

The maximum OPD for each interferogram is

OPDmax=4lmax.
where lmax is the maximum displacement of the moving DSM from the ZPD position.

The theoretical spectral resolution δσ of the UVS is

δσ=12OPDmax=18lmax.
Considering the effect of the apodization (e.g. triangular function) of the interferogram, the desired spectral resolution of the UVS can be calculated by

δσ=14lmax.

Suppose that K is the number of sampling points for each unilateral interferogram. Based on Eqs. (5) and (7), it can be obtained that

K=8lmaxσmax.
The resolving power of the UVS is determined by the number of sampling points for the interferogram (i.e., R=σmax/δσ=K). For the spectrometer proposed in [17], the resolving power is determined by the number of pixels per row of the detector. The number of sampling points for the interferogram can be much larger than the number of pixels per row of the detector. Therefore, the resolving power of the UVS can be much higher than that of the spectrometer proposed in [17].

Table 1

Tables Icon

Table 1. Comparisons of the UVS with Interferometry, Dispersive, and Color Filter Approaches

shows both the main advantages and disadvantages of the UVS compared with other existing spectrometers.

3. Design calculation and numerical simulation

Suppose that the source spectrum covers a wavelength range from 250 nm to 450 nm, i.e., a wavenumber range from 22222.2 cm−1 to 40000 cm−1. The wavelength difference versus wavenumber difference for several wavelengths are shown in Table 2

Tables Icon

Table 2. Wavelength Difference Versus Wavenumber Difference for Several Wavelengths

. Based on Table 2, if the desired spectral resolution (in wavelength) of the UVS is 0.005 nm at 250 nm, 0.01 nm at 350 nm, together with 0.02 nm at 450 nm, the desired spectral resolution (in wavenumber) of the UVS should be δσ=0.8cm1. The theoretical spectral resolution of the UVS can be δσ=0.4cm1. Thus, the maximum displacement of the moving DSM from the ZPD position is lmax=1/(8δσ)=1/(4δσ)=3.125mm. Accordingly, the number of sampling points for each interferogram is K=8lmaxσmax=8×3.125mm×40000cm1=100000.

A suitable material for the plane transmission grating in a UVS is Fused silica. The formula of refractive index for fused silica can be written as [31]

n2=1+0.6961663λ2λ20.06840432+0.4079426λ2λ20.11624142+0.8974794λ2λ29.8961612.

Suppose that f=100mm, b=0.02mm, λC=350nm, α=10°, and the transmission grating with 200 grooves/mm. From Eqs. (2), (3) and (11), the y-axis coordinate for wavelength λi at the detector plane is shown in Fig. 3

 figure: Fig. 3

Fig. 3 The y-axis coordinate of different wavelengths at detector plane.

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. From Eq. (4), the number of pixels of the one-dimensional detector must be greater than |y(λ250)y(λ450)|/b(2.0646+2.0524)/0.02=205.85. Hence, 206 separate interferograms are obtained simultaneously in one scan period of the moving DSM. According to Eqs. (2), (3), (6), and (11) together with the above parameter values, several unilateral interferograms generated simultaneously by the UVS in one scan period of the moving DSM are shown in Fig. 4
 figure: Fig. 4

Fig. 4 Several interferograms obtained simultaneously by the UVS.

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.

Figure 5

 figure: Fig. 5

Fig. 5 UVS interferogram 1 containing merely wavelength 250, 250.005, 250.01, 250.015, 250.02 nm and its spectrum.

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shows the UVS interferogram 1 containing merely wavelength 250 nm, 250.005 nm, 250.01 nm, 250.015 nm, 250.02 nm and the spectrum obtained from Fourier transform of the interferogram 1 when the theoretical spectral resolution is 0.4 cm−1. Five spectral peaks are clearly visible, so the spectral resolution of the UVS is at least 0.005 nm at 250 nm. Figure 6
 figure: Fig. 6

Fig. 6 UVS interferogram 104 containing merely wavelength 349.98, 349.99, 350, 350.01, 350.02 nm and its spectrum.

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shows the UVS interferogram 104 containing merely wavelength 349.98 nm, 349.99 nm, 350 nm, 350.01 nm, 350.02 nm and the spectrum obtained from Fourier transform of the interferogram 104 when the theoretical spectral resolution is 0.4 cm−1. Figure 7
 figure: Fig. 7

Fig. 7 UVS interferogram 206 containing merely wavelength 449.92, 449.94, 449.96, 449.98, 450 nm and its spectrum.

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shows the UVS interferogram 206 containing merely wavelength 449.92 nm, 449.94 nm, 449.96 nm, 449.98 nm, 450 nm and the spectrum obtained from Fourier transform of the interferogram 206 when the theoretical spectral resolution is 0.4 cm−1. It can be easily obtained that the spectral resolution of the UVS is at least 0.01 nm at 350 nm together with 0.02 nm at 450 nm.

4. Conclusion

An ultrahigh-resolution rapid-scan ultraviolet-visible spectrometer (UVS) is investigated. The first significant advantage of the UVS is that the multiplex disadvantage of ultraviolet-visible interferometry is greatly reduced by combining interferometric and dispersive spectroscopy. The second important advantage of the UVS is ultrahigh spectral resolution for a broadband spectral range in ultraviolet-visible spectral region. The third advantage is that the UVS will be able to achieve rapid-scan if specific electronics downstream is used. The fourth advantage of the UVS, compared with traditional interferometry, is that the dynamic range requirement of the detector is reduced. There are also the trade-offs for the UVS: (1) the presence of a moving part will reduce the stability against various disturbances, (2) the scanning nature will make the data collection time long and, therefore, make the UVS unsuitable for measuring the spectra from transient sources. Although no instrument or prototype is actually built or tested, and the calculations represent only the first-order optical effects (i.e., none of the aberrations of actual optical systems are present), the UVS is a unique design to greatly reduce the multiplex disadvantage of ultraviolet-visible multiplexed spectroscopy while achieving rapid-scan combined with ultrahigh spectral resolution for a wide spectral range (e.g., 0.005 nm at 250 nm, 0.01 nm at 350 nm together with 0.02 nm at 450 nm). The UVS will be suitable for ultrahigh-resolution ultraviolet-visible spectral measurement.

Funding

National Natural Science Foundation of China (NSFC) (61605151).

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Figures (7)

Fig. 1
Fig. 1 Optical layout of the ultraviolet-visible spectrometer (UVS).
Fig. 2
Fig. 2 Equivalent light path diagram in the meridian plane of the UVS.
Fig. 3
Fig. 3 The y-axis coordinate of different wavelengths at detector plane.
Fig. 4
Fig. 4 Several interferograms obtained simultaneously by the UVS.
Fig. 5
Fig. 5 UVS interferogram 1 containing merely wavelength 250, 250.005, 250.01, 250.015, 250.02 nm and its spectrum.
Fig. 6
Fig. 6 UVS interferogram 104 containing merely wavelength 349.98, 349.99, 350, 350.01, 350.02 nm and its spectrum.
Fig. 7
Fig. 7 UVS interferogram 206 containing merely wavelength 449.92, 449.94, 449.96, 449.98, 450 nm and its spectrum.

Tables (2)

Tables Icon

Table 1 Comparisons of the UVS with Interferometry, Dispersive, and Color Filter Approaches

Tables Icon

Table 2 Wavelength Difference Versus Wavenumber Difference for Several Wavelengths

Equations (11)

Equations on this page are rendered with MathJax. Learn more.

m λ i =d[ n( λ i )sinα+sin θ m ( λ i ) ].
y( λ i )=f τ( λ c ) 1 τ 2 ( λ i ) τ( λ i ) 1 τ 2 ( λ c ) 1 τ 2 ( λ c ) 1 τ 2 ( λ i ) +τ( λ c )τ( λ i ) ,
τ( λ )= λ d n( λ )sinα.
N | y( λ max )y( λ min ) | b .
X 1 2 σ max .
I( l )= 0 B( σ )[ 1+cos( 8πσl ) ]dσ .
OPD max =4 l max .
δσ= 1 2 OPD max = 1 8 l max .
δ σ = 1 4 l max .
K=8 l max σ max .
n 2 =1+ 0.6961663 λ 2 λ 2 0.0684043 2 + 0.4079426 λ 2 λ 2 0.1162414 2 + 0.8974794 λ 2 λ 2 9.896161 2 .
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