Abstract
We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The factor of both defect modes for varying defect sizes is characterized, and an enhancement of relative to individual loaded resonators is demonstrated. The defect modes are then compared with coupled resonator–induced transparency (CRIT), indicating that the defect modes based on side-coupled microresonator arrays are actually the extension of the CRIT resonance in two-resonator structures.
©2012 Optical Society of America
Full Article | PDF ArticleMore Like This
Yosef M. Landobasa and Mee K. Chin
Opt. Express 13(20) 7800-7815 (2005)
Landobasa Y. M. Tobing, Pieter Dumon, Roel Baets, and Mee-Koy Chin
Opt. Lett. 33(17) 1939-1941 (2008)
Hsi-Chun Liu and Amnon Yariv
Opt. Express 20(8) 9249-9263 (2012)