Abstract
A one-dimensional escape-probability function is derived for electrons optically excited in a thin film. The effects of electron–electron scattering, electron–phonon scattering, and finite reflection at the film interfaces are taken into account. Numerical examples are presented to illustrate the dependence of the escape probability on the film thickness and the amount of back scattering from the substrate. An application to photoemission from thin metal films is discussed.
© 1972 Optical Society of America
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