Abstract
A method is described to characterize the effect of 4880-Å light on a thin layer of hardened dichromated gelatin in terms of the dielectric constant of the gelatin. The light diffracted by a periodic variation of the dielectric constant of a thin layer is calculated numerically and plotted as a function of the relevant parameters of the thin layer. The change of the dielectric constant of the thin layer of gelatin after exposure to 4880-Å light is obtained by comparing experimentally obtained data with the calculated data.
© 1971 Optical Society of America
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