Abstract
Correlation and spectral-density functions for the film records of speckle patterns have been calculated. The reflections from both a random and a deterministic reflecting surface were examined, and in each case, the resultant spectral-density function consisted of an aperture function multipled by a function dependent upon the reflecting surface. The near-field speckle pattern was found to differ from that obtained in the far field. This difference is an inconvenience only because a method was shown whereby the far-field pattern could be obtained in the near field.
© 1970 Optical Society of America
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Dorian Kermisch
J. Opt. Soc. Am. 60(1) 15-17 (1970)
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