Abstract
Passive components for high-speed dense wavelength-division-multiplexing
(DWDM) optical networks must be characterized precisely for both loss and dispersion
properties: spectral loss, polarization-dependent loss (PDL), group delay (GD), and
differential GD (DGD). The ability to test all parameters will be essential in the
development and manufacture of passive optical devices and modules such as fiber
gratings, arrayed waveguide gratings, or add–drop modules, particularly for
40-Gbit/s networks. New techniques such as swept homodyne interferometry are
currently developed for full characterization of modern optical devices. Here we
review the latest development in optical component testing for all-loss and
all-parameter tests.
© 2002 Optical Society of America
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