Abstract
A polarization Fizeau interferometer based on birefringent thin film is
presented. The interferometer adopts a birefringent thin film to obtain orthogonally
polarized and strictly common-path reference and test beams. Advantages include ease
of implementation on large-aperture interferometer, measuring test optics from long
distance, and achieving high fringe visibility. The phase shift is obtained by
combining a quarterwave plate and an analyzer. The concepts illustrated are verified
experimentally.
© 2012 Chinese Optics Letters
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