Abstract
High-power polarization-division-multiplexing (PDM) systems or functional
modules, such as self-phasemodulation (SPM)-based all-optical regenerators,
cross-phase-modulation (XPM)-based wavelength convertors or format convertors,
all-optical logical gate, and so on, may suffer from the effects of pattern
dependence. Such effects are experimentally investigated using relative time delay
variation between bit sequences with orthogonal polarization states in a 2 x 10.65
Gb/s high-power on-off keying (OOK) PDM system. Eye-diagram-based signal-to-noise
ratio (SNR) and bandwidth of broadened spectrum are measured and compared. An
eye-diagram-based SNR fluctuation of up to 4 dB may occur as the delay changes.
© 2012 Chinese Optics Letters
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