Abstract
To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting (k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF2 and Si substrates are determined in the IR spectral range of 4–8 µm.
© 2022 The Author(s)
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription