Abstract
Calibration of the Raman shift scale of a compact spectrometer with a charge-coupled device (CCD) array detector is examined. Argon and neon line spectra are used as wavelength standards, and a shift standard is used to track changes in the wavelength of the doubled Nd:YAG laser line. A method is described to introduce controlled shifts of spectra relative to the detector elements. Excellent precision, on the order of 0.05 cm<sup>-1</sup>, is achieved in measuring Raman shift values over a period of several weeks. The abscissa accuracy, examined with the use of both Raman lines of known shift and atomic line wavelengths, is considerably poorer than the precision. The likely origins of this discrepancy are discussed.
PDF Article
More Like This
Compact multichannel spectrometer employed for soft x-ray spectrum diagnostics at the Shenguang-III Laser Facility
Hanwei Liu, Baozhong Mu, Shenye Liu, Xufei Xie, Xingsen Che, Jie Xu, Xin Wang, Liang Chen, Wenjie Li, Kaijun Shi, and Yongkun Ding
Opt. Express 30(25) 45792-45806 (2022)
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription