Abstract
Direct sample insertion (DSI) is a particularly attractive method for sample introduction for inductively coupled plasma-atomic emission spectrometry (ICP-AES). In this approach a sample is placed into or onto a probe with subsequent introduction of the sample carrying probe, <i>via</i> the central tube of the torch, into the plasma. An extensive review of DSI devices for the ICP has been presented by Karanassios and Horlick.
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