Abstract
Measurements in the infrared region using semiconductor lasers, particularly as applied to atmospheric pollution monitoring, depend critically on the availability of reliable line positions and linewidth information. We demonstrate a unique internal calibration technique such that spectral locations can be determined accurately, to the order of the monochromaticity of the laser. This is based on low-pressure absorption measurements and subsequent fitting of a Voigt profile and determining the Doppler component. With this technique, we are able to determine the self- and the N<sub>2</sub>-broadening parameters of the NH<sub>3</sub> line at 852.7 cm<sup>−1</sup> to be 26.2 ± 0.4 MHz Torr<sup>−1</sup> and 5.2 ± 0.1 MHz Torr<sup>−1</sup>, respectively. Also, the spectral locations for several SO<sub>2</sub> lines in the 1180.1 cm<sup>−1</sup> region were determined accurately.
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