Abstract
In process control, solder samples are routinely analyzed by x-ray spectroscopy. In our laboratory, the standards and samples are prepared by the chill-casting method developed by Zanin and Hooser because the method has the advantages of (1) homogeneity of the prepared samples, (2) control of the sample's metallurgical history, and (3) rapid sample preparation. However, our work has shown that the standards change with time resulting in an increase in their net tin intensities. If uncontrolled, this change can result in erroneous analyses.
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