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Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces: erratum

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Abstract

In the previously published paper by Azzam [Appl. Opt. 53, 6212 (2014) [CrossRef]  ], the analyzer azimuth for detecting the second angle of incidence is incorrect. It has been revised below.

© 2015 Optical Society of America

In [1] the analyzer azimuth, A2=90°A1, for detecting the second angle of incidence φC2(> the Brewster angle φB) at which Rs=2Rp (using a null-seeking polarizer-surface-analyzer (PSA) ellipsometer with a φ2φ goniometer) is incorrect. For incident linearly polarized light at azimuth P=45°, the second analyzer azimuth at null should be A2=A1=35.264°, because the p and s components of the electric vector of reflected light are 180° out of phase at φC1<φB but are in phase at φC2>φB, in accordance with the Nebraska–Muller conventions [2].

Careful analysis shows that the precision of locating φC2 is better than that of locating φB. However, the opposite is true with respect to φC1. The second sentence after Eq. (19) in [1] should be amended accordingly.

I am pleased to acknowledge Xusheng Zhang, Beijing Institute of Technology, for comments that prompted this erratum.

References

1. R. M. A. Azzam, “Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces,” Appl. Opt. 53, 6212–6215 (2014). [CrossRef]  

2. R. H. Muller, “Definitions and conventions in ellipsometry,” Surf. Sci. 16, 14–33 (1969). [CrossRef]  

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