Abstract
In the previously published paper by Azzam [Appl. Opt. 53, 6212 (2014) [CrossRef] ], the analyzer azimuth for detecting the second angle of incidence is incorrect. It has been revised below.
© 2015 Optical Society of America
In [1] the analyzer azimuth, , for detecting the second angle of incidence (> the Brewster angle ) at which (using a null-seeking polarizer-surface-analyzer (PSA) ellipsometer with a goniometer) is incorrect. For incident linearly polarized light at azimuth , the second analyzer azimuth at null should be , because the and components of the electric vector of reflected light are 180° out of phase at but are in phase at , in accordance with the Nebraska–Muller conventions [2].
Careful analysis shows that the precision of locating is better than that of locating . However, the opposite is true with respect to . The second sentence after Eq. (19) in [1] should be amended accordingly.
I am pleased to acknowledge Xusheng Zhang, Beijing Institute of Technology, for comments that prompted this erratum.
References
1. R. M. A. Azzam, “Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces,” Appl. Opt. 53, 6212–6215 (2014). [CrossRef]
2. R. H. Muller, “Definitions and conventions in ellipsometry,” Surf. Sci. 16, 14–33 (1969). [CrossRef]