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Accurate measurement of the frequency offset of the laser based on electromagnetically induced transparency
Applied Optics- received 03/11/2024; accepted 05/01/2024; posted 05/01/2024; Doc. ID 523527
- Abstract: We propose a method using electromagnetically induced transparency (EIT) to measure the frequency offset of the laserrelative to a cavity's resonance frequency, thereby reducing the laser detuning when preparing Rydberg atoms. Laserreflection by the vapor cell enables observation of two EIT peaks corresponding to the co-propagating and counterpropagating beams, and the peaks' position is related to laser detuning, allowing us to estimate the frequency offset of theprobe and coupling laser. The method reduces the measurement uncertainty compared to directly observing saturatedabsorption spectroscopy (SAS) and EIT, making it suitable for applications that require strict control over laser detuning.