Abstract
Soft-x-ray Bragg reflection from two multilayers with 10 and 63 periods was used for inde pendent determination of both real and imaginary parts of the refractive index close to the boron K edge (). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to and various boron oxides.
© 2009 Optical Society of America
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