Abstract
We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors.
© 2002 Optical Society of America
Full Article | PDF ArticleMore Like This
Charalambos C. Katsidis and Dimitrios I. Siapkas
Appl. Opt. 41(19) 3978-3987 (2002)
C. L. Mitsas and D. I. Siapkas
Appl. Opt. 34(10) 1678-1683 (1995)
N. A. Stathopoulos, S. P. Savaidis, A. Botsialas, Z. C. Ioannidis, D. G. Georgiadou, M. Vasilopoulou, and G. Pagiatakis
Appl. Opt. 54(6) 1492-1504 (2015)