Abstract
A step-by-step procedure for the manufacture of Zernike disks and the design and fabrication of a laboratory Zernike test instrument are described. A laboratory wavefront error simulator is used to evaluate the low-order aberration measurement sensitivity of the Zernike test instrument. Measurement sensitivities were found to be better than λ/100 for all the low-order aberration types.
© 1977 Optical Society of America
Full Article |
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (3)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (2)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription