Author Affiliations

J.A. Deibel,¹ J. Kono,¹ D. M. Mittleman,^1,* W. H. Fan,² P. C. Upadhya,² A. Sengupta,² J. Cunningham,² E. H. Linfield,² A. G. Davies,² and H. Munekata³

¹Department of Electrical and Computer Engineering, MS 366, Rice University, Houston, Texas 77251-1892

²School of Electronic and Electrical Engineering, University of Leeds, Woodhouse Lane, Leeds LS2 9JT, UK

³Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama, Kanagawa 226-8503, Japan

^*Corresponding author: daniel@rice.edu